SPES technology by EOS Instruments provides access to significantly more particle information compared to conventional analytical methods, thanks to a truly multiparametric measurement of optical properties at the single-particle level.
While most traditional techniques rely on single-parameter measurements and 1D representations—typically particle size and often based on strong assumptions—SPES enables advanced 2D and 3D particle analysis, allowing deeper insight into complex samples and clear discrimination of different particle populations.
Comprehensive physical and statistical information can be directly extracted from SPES-generated 2D and 3D data visualizations. These allow users to rapidly isolate specific particle populations of interest and retrieve key parameters such as particle size distribution, numerical concentration, and oversize analysis.
EOS Instruments analytical platforms represent a breakthrough in the study of complex particle mixtures and heterogeneous systems across industrial, environmental, and biological applications. They are particularly effective for advanced particle characterization tasks such as impurity detection, formulation optimization, and monitoring of production quality, including the identification of out-of-spec materials.
The comparison below highlights the advantages of SPES technology over conventional particle analysis techniques, including Dynamic Light Scattering (DLS), Static Light Scattering (SLS), and Nanoparticle Tracking Analysis (NTA), particularly in terms of resolution, calibration-free measurement, and suitability for complex systems.
- Related to instruments in the particle size range 200nm - 20µm
- High Size resolution
- No Calibration
- Suitable for complex system
- Particle classification
- Inline Online
- Cost effective
SPES
Single Particle Diffraction (SPD, SPOS)
Multiple Particle Diffraction (SLS)
Dynamic Light Scattering (DLS)
Nanoparticle Tracking Analysis (NTA)
Visual Inspection (Microscope, TEM, SEM)
Coulter & Similar Tech
Among traditional particle analysis techniques, optical methods such as light scattering have gained widespread adoption in both scientific research and industrial applications. However, these methods often rely on simplified assumptions that limit their effectiveness when analyzing complex or heterogeneous samples.
Particle scattering behavior depends on multiple parameters, making simple measurements of scattering intensity—or extinction—insufficient for accurate particle characterization beyond rough size estimation. The complexity further increases when analyzing particle populations, where data interpretation often requires solving mathematically ill-posed inverse problems.
Conventional techniques such as Dynamic Light Scattering (DLS), Static Light Scattering (SLS), and Light Obscuration (LO) rely heavily on a priori assumptions regarding particle composition, structure, and refractive index, as well as their interaction with the surrounding medium. These assumptions can introduce significant inaccuracies, particularly in complex or polydisperse systems.
Additionally, DLS and SLS techniques depend on complex inversion algorithms that may introduce artifacts into the resulting particle size distributions, reducing reliability and reproducibility in real-world applications.
SPES technology provides a complete, calibration–free optical fingerprint of the sample, enabling accurate and assumption-free particle characterization.
EOS Instruments’ proprietary algorithms and advanced data analysis tools enhance the ability to identify, classify, and quantify particle populations, even in highly complex systems where traditional methods fail.
