The all-in-one Classizer™ software platform offers an intuitive solution for fast and reliable measurements, featuring dedicated tabs for acquisition and analysis. Standard operations and advanced add-ons for data acquisition and analysis are readily available. Customizable Operative Procedures can also be developed within the software to meet specific user needs.
Several internal checks are performed continuously to ensure high quality and reliability of the SPES, SPES², SPESe, and μDHM data. Real-time warnings and expert advice are provided to the user in real time during the data acquisition to save time and increase the quality of the results.
Data is continuously saved in both standard and Continuous Flow Analysis CFA mode, limiting data loss and unintentional file overwriting. Comments and operator observations can be added to the data during acquisition and analysis. Custom solutions, analysis tools and communication protocols are available through dedicated software packages and add-ons.
The analysis tab allows the operator to quickly view key sample characteristics at a glance. EOS Classizer™ software offers multiple tools for performing a thorough analysis and retrieve valuable information that is typically inaccessible to standard particle sizers and counters. Gaining advanced knowledge of your particles is finally achievable!
Thanks to the unique EOS CLOUDS and SPES, SPES², SPESe, and μDHM data, the user can easily select any individual particle population detected in the fluid and displayed in the 2D histogram. Numerical particle size distribution, statistical parameters and concentration are readily retrieved, either of the whole sample or of the population of interested selected via the software with just a few clicks. Advanced features like aggregation state, particle payload and aspect ratio are available via software add-ons. Sophisticated algorithms as Principal Component Analysis (PCA) enable comparison and correlation of the behaviour of individual components in heterogeneous mixtures and in batch-to-batch and raw material Quality Controls.
The default analysis assumes particles to be dielectric spheres described by the Mie theory, but the SPES data can deliver much more!
Benefit from SPES technology by loading your specific data library for the classification, analysis, and interpretation of
Accurately perform oversize analysis by comparing particle populations across different batches using customizable oversize thresholds. Define your own critical size values and automatically generate comprehensive reports with both tabular data and graphical visualizations.
