Abrasive slurries are critical process materials in semiconductor manufacturing, precision optics, advanced ceramics and high-performance surface finishing. Their efficiency depends on particle size distribution, particle concentration, morphology, refractive index and the absence of oversized contaminants or aggregates. Accurate characterization of abrasive particles enables manufacturers to optimize polishing performance, improve process repeatability and reduce surface defects. Classizer™ ONE, based on the patented SPES technology, provides advanced single-particle characterization, supporting research, process development and quality assurance through rapid multiparametric particle analysis.




