Polymeric particle dispersions are widely used across pharmaceutical, personal care, food, pigments, inks, ceramics, and advanced material applications. Maintaining stable and well-dispersed particle systems is essential to prevent aggregation, sedimentation, oversize formation, and long-term product instability.

The Classizer™ particle analyser, based on the patented SPES technology by EOS Instruments, introduces an advanced approach to single-particle optical characterization. By combining extinction and scattering measurements, SPES technology enables accurate identification and analysis of different particle populations throughout formulation development, process optimization, and final product quality control.

Example of application: polystyrene spheres

Polystyrene (PS) spheres are widely employed as reference materials for particle size analysis, calibration, and validation workflows. The Classizer™ ONE, powered by patented SPES technology, provides accurate particle characterization for colloidal formulations and supports verification of Quality-by-Design targets during formulation and manufacturing processes.

Depending on system configuration and sample preparation, the Classizer™ ONE enables analysis across a dynamic particle size range from 0.2 to 20 μm, with concentration measurements between 1E5 and 1E7 ptc/mL. Automated dilution systems and autosampler configurations are also available to support high-throughput and reproducible particle analysis.

The figures show the high-resolution characterization capabilities of SPES technology applied to 0.5 μm polystyrene particles dispersed in filtered water. Thousands of validated particles populate the EOS CLOUDS map, generating a precise optical fingerprint used for quantitative particle analysis.

The particle cloud distribution reflects relative particle concentration and optical behavior, while the numerical particle size distribution confirms the accuracy and reproducibility of the Classizer™ ONE system. The measured average particle diameter and refractive index demonstrate the capability of SPES technology to provide reliable and calibration-free particle characterization.

 

Example of application: heterogeneous samples

Heterogeneous particle samples containing multiple particle sizes or refractive indexes are often difficult to analyze using conventional particle characterization techniques. Overlapping particle populations can significantly reduce measurement accuracy and limit the reliability of standard analytical methods.

Thanks to the patented multiparametric SPES technology by EOS Instruments, the Classizer™ ONE can discriminate and classify individual particle populations according to their optical properties. Different particle populations generate distinct EOS CLOUDS distributions that can be independently selected, quantified, analyzed, and compared, enabling advanced characterization of complex heterogeneous dispersions.

 

The figures demonstrate the capability of SPES technology to resolve and characterize heterogeneous particle systems containing multiple particle populations.

In the first example, PMMA and PS submicron particles generate two clearly separated EOS CLOUDS distributions, allowing independent analysis of particle concentration and optical properties for each population. In the second example, silicon oil emulsions and polystyrene tracer particles are simultaneously detected and distinguished, confirming the effectiveness of SPES technology for complex multiphase and heterogeneous fluid analysis.