- Related to instruments in the particle size range 100nm - 50µm
- High Size resolution
- No Calibration
- Suitable for complex system
- Particle classification
- Inline Online
- Cost effective
Single Particle Diffraction (SPD, SPOS)
Multiple Particle Diffraction (SLS)
Dynamic Light Scattering (DLS)
Nanoparticle Tracking Analysis (NTA)
Visual Inspection (Microscope, TEM, SEM)
Coulter & Similar Tech
SPES (Single Particle Extinction and Scattering) patented optical technology accesses to more information on the measured particles than the other methods. Therefore, SPES is the perfect candidate to supersede traditional particle sizer for the characterization and development of products based on subvisible/submicron particles in industrial, environmental and biological complex fluids.
Instruments for the analysis of particle size distribution in fluids are mainly based on light scattering methods (see table). However, the scattered light depends not only by the particle size but drastically also by its shape, composition and structure and by the fluid in which the particle is suspended. Traditional optical methods, such as Dynamic Light Scattering (DLS), Static Light Scattering (SLS) and Light Obscuration (LO), require limiting a priori assumptions on the particles composition ans structure and they assume that all particles are made by the same material and no interaction occurs between the particles and the fluid. Moreover, both DLS and SLS are based on complex retrieval algorithms that could introduce artefacts in the resultant particle size distribution.
On the contrary, SPES is able to obtain a complete optical fingerprint of the sample (see “how does SPES work”). SPES directly measures at the same time different particle parameters, without a priori speculations. EOS proprietary algorithms and specific data analysis complete the instrument ability to discriminate and analyse samples even in situation when traditional methods fail.